Se hai scelto di non accettare i cookie di profilazione e tracciamento, puoi aderire all’abbonamento "Consentless" a un costo molto accessibile, oppure scegliere un altro abbonamento per accedere ad ANSA.it.

Ti invitiamo a leggere le Condizioni Generali di Servizio, la Cookie Policy e l'Informativa Privacy.

Puoi leggere tutti i titoli di ANSA.it
e 10 contenuti ogni 30 giorni
a €16,99/anno

  • Servizio equivalente a quello accessibile prestando il consenso ai cookie di profilazione pubblicitaria e tracciamento
  • Durata annuale (senza rinnovo automatico)
  • Un pop-up ti avvertirà che hai raggiunto i contenuti consentiti in 30 giorni (potrai continuare a vedere tutti i titoli del sito, ma per aprire altri contenuti dovrai attendere il successivo periodo di 30 giorni)
  • Pubblicità presente ma non profilata o gestibile mediante il pannello delle preferenze
  • Iscrizione alle Newsletter tematiche curate dalle redazioni ANSA.


Per accedere senza limiti a tutti i contenuti di ANSA.it

Scegli il piano di abbonamento più adatto alle tue esigenze.

Economia

COMUNICATO STAMPA - Responsabilità editoriale di Business Wire

JEOL: Launch of the FIB-SEM System “JIB-PS500i” with High Precision and High Resolution

Business Wire

JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023.

This press release features multimedia. View the full release here: https://www.businesswire.com/news/home/20230123005841/en/

FIB-SEM System "PS500i" (Photo: Business Wire)

FIB-SEM System "PS500i" (Photo: Business Wire)

With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.
This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.

Main Features

  1. The FIB column enables processing with a large-current Ga ion beam up to 100nA. The high-current processing is particularly effective in preparing cross section samples for large-area imaging and analysis. In addition, the FIB column is set to a shorter working distance. Along with a newly-developed power supply, it has led to greatly improved processing performance at a low accelerating voltage.
  2. A newly-developed super conical lens system is built into the SEM column, greatly improving the image resolution at a low accelerating voltage. This superb imaging is very useful to check the end-point milling status of lamella specimen using the SEM.
  3. The JIB-PS500i adopts a large specimen chamber and a newly-developed specimen stage, increasing the stage movement range, and thus accommodating a large specimen.
    In addition, a newly-developed STEM detector that can be used with the stage tilt at 90 degrees, allows for a seamless transition from the TEM specimen preparation to STEM observation.
  4. For the operating GUI, the “SEM center”, which has been well received in the JSM-IT800 series of high-resolution scanning electron microscopes is employed, enabling full integration of EDS analysis.
  5. A double tilt cartridge and a dedicated TEM holder allows for more precise alignment while making specimen transfer between TEM and FIB easier.

Sales target
50 units/year

Product URL: https://www.jeol.com/products/scientific/fib/JIB-PS500i.php

JEOL Ltd.
3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, President & CEO
(Stock code: 6951, Tokyo Stock Exchange Prime Market)
www.jeol.com

JEOL Ltd.
Science and Measurement Instruments Sales Division
TEL: +81-3-6262-3567
https://www.jeol.com/contacts/products.php

Permalink: http://www.businesswire.com/news/home/20230123005841/en

COMUNICATO STAMPA - Responsabilità editoriale di Business Wire

Video Economia


Vai al sito: Who's Who

Modifica consenso Cookie